In search of a more efficient probing approach for logic devices,
JEM developed the Logic Shelf Probe Cards. The
Logic Shelf probe cards are recommended for devices with
peripheral pads. Based on the existing
cantilever technology, the Logic Shelf probe card features
a bridge construction and a unique probe layout. Compared
to the conventional diagonal quad configuration, the bridge
construction offers more consistent scrub marks and balanced
contact force while the unique probe layout results in higher
test productivity. In a test productivity study with 200mm
wafer, the conventional diagonal quad probe card required
89 touchdowns to test one wafer while the Logic Shelf 2x2
probe card required only 75 touchdowns. That equals to 15%
reduction in touchdowns. With fewer touchdowns required, test
time will be shortened and throughput will be increased, contributing
to lower cost of ownership.
1x2 and 2x2 configurations are available. Other
configurations may be available upon request. |